SN74BCT8373ADW spec: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES

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SN74BCT8373ADW Datasheet i Spec

Producent : TI

Opakowanie : DW

Pins : 24

Temperatura : Min 0 °C | Max 70 °C

Rozmiar : 323 KB

Zastosowanie : IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES